SEM | What is SEM? How does SEM image works?

SEM technique is called Scanning Electron Microscopy. With the ingenious optical microscope, visible light images are captured by the electron beam of an electron microscope, which serves as the light source, and the electromagnetic field serves as electrons. Determine the object's surface structure. The diagram of the instrument is shown in Figure 1.

Various types of electrons, photons, or radiation can be generated by the interaction between electrons and samples. Figure 2 shows SEM's primary purpose: collecting secondary electrons (SE) and backscattered electrons (BSE) to image objects. Signals in this format are amplified. Imaging and observing are then possible. As a general rule, when an electron beam is focused on a test piece, its surface will be hit by electrons and be released by impact. A less than 50 eV amount of energy has been released. An electron resting on top of the sample. The image information is close to the surface topography after being imaged by the secondary electron detector. When backscattered electrons interact with atomic nuclei in the sample, they cause elastic scattering, whose energy is the same as that of incident electrons. Electrons carry information about an element's composition. The BSE image illustrates the contrast between atomic orders. In the BSE image, the brighter the element, the higher it is.

The characteristics of a coating are affected greatly by its microstructure and its process parameters. Negative bias and working pressure strongly influence the grain size of columnar crystals formed during the coating process, and coating hardness is a function of both grain size and crystal orientation. A successful microscopic analysis of the interface epitaxial condition can determine the coating's adhesion characteristics. Therefore, good microscopic analysis techniques and tools are crucial for understanding the characteristics of the coating. Scanning electron microscopes are used for a variety of purposes including the analysis of materials. Smaller and smaller materials are increasingly being used in more applications, so microfabrication has become more vital in recent years. SEM is primarily used to observe the surface morphology or microstructure of objects. The test piece is relatively easy to make, with a resolution of up to nanometers and a long depth of field. Observation of the material's microscopic appearance reveals that it is extremely clear, and it has been widely Utiliz.

微觀結構組織的尺寸

With the integration of SEM and EDS (Energy Analytical Analysis) SEM will enable users to analyze their specific areas and organizations, and run point scans, line scans and surveys of their chosen areas. Sharing SEM case studies Take our product for instance. Figure (1) shows an image magnified 60,000 times. The range of filming is indicated by the red arrow in the image. In Figure (2), the part in the red frame is a test-through diagram, which shows a uniform inlaid film and a solid film layer.